Excess noise level in MOS structures without straight-through macrodefects in the dielectric
G. P. Zhigal'skii, A. S. Fedorov, A. N. BoltnevVolume:
26
Language:
english
Pages:
6
DOI:
10.1007/bf01034881
Date:
July, 1983
File:
PDF, 537 KB
english, 1983