Examiner effects in adoption studies of intelligence

Behavior Genetics 1980 / 07 Vol. 10; Iss. 4

Examiner effects in adoption studies of intelligence

Lee Willerman, John C. Loehlin, Joseph M. Horn, Sandra Scarr, Richard A. Weinberg
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Volume:
10
Language:
english
Pages:
4
DOI:
10.1007/bf01065606
Date:
July, 1980
File:
PDF, 208 KB
english, 1980
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