Apparatus for dynamic piezooptic investigations on...

Apparatus for dynamic piezooptic investigations on semiconductors in the temperature region between 100 and 500°K

M. Ochel
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Volume:
5
Year:
1970
Language:
english
Pages:
1
DOI:
10.1002/crat.19700050218
File:
PDF, 178 KB
english, 1970
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