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Investigation of multiple layer heterojunction structures by means of an electron-beam microprobe-analyzer
Dr. Ž. I. Alferov, V. M. Andreev, S. G. Konnikov, V. I. Kolyškin, V. R. Larionov, G. N. ŠelovanovaVolume:
8
Year:
1973
Language:
english
Pages:
7
DOI:
10.1002/crat.19730080908
File:
PDF, 274 KB
english, 1973