On the measurements of lattice parameters of semiconductor...

On the measurements of lattice parameters of semiconductor thin films

B. Dogil, A. J. Horodecki, W. Precht
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Volume:
12
Year:
1977
Language:
english
Pages:
1
DOI:
10.1002/crat.19770121214
File:
PDF, 110 KB
english, 1977
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