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Comparison of X-ray topographical images in implanted silicon crystals at different absorption conditions
Dr. Z. Furmanik, Dr. H. Hubrig, M. Maciaszek, I. S. VassilevVolume:
14
Year:
1979
Language:
english
Pages:
3
DOI:
10.1002/crat.19790140312
File:
PDF, 450 KB
english, 1979