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Investigation of structural defects in polycrystalline silicon by electron microscopy
Dr. S. S. Gorelik, Dr. Z. A. Zarifyants, Prof. L. S. Milevskii, Dr. T. B. SagalovaVolume:
16
Year:
1981
Language:
english
Pages:
3
DOI:
10.1002/crat.19810160222
File:
PDF, 221 KB
english, 1981