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Misleading fringes in TEM images and diffraction patterns of Si nanocrystallites
Hideo Kohno, Nobuhiko Ozaki, Hideto Yoshida, Koji Tanaka, Seiji TakedaVolume:
38
Year:
2003
Language:
english
Pages:
5
DOI:
10.1002/crat.200310140
File:
PDF, 345 KB
english, 2003