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Transmission electron microscopy and Rutherford backscattering spectrometry studies of Ag2Te films formed from Ag-Te thin film couples
B. C. Mohanty, S. KasiviswanathanVolume:
41
Year:
2006
Language:
english
Pages:
5
DOI:
10.1002/crat.200410530
File:
PDF, 529 KB
english, 2006