Semiconductor Properties of Polycrystalline CuBr by Hall Effect and Capacitive Measurements
P. Knauth, Y. Massiani, M. PasquinelliVolume:
165
Year:
1998
Language:
english
Pages:
5
DOI:
10.1002/(sici)1521-396x(199802)165:23.0.co;2-w
File:
PDF, 193 KB
english, 1998