Temperature dependence of the X-ray diffuse scattering intensity in V3Si in the temperature range from 8 to 300 K
Acad., Prof. N. N. Sirota, L. P. Polutchankina, N. S. OrlovaVolume:
18
Year:
1983
Language:
english
Pages:
6
DOI:
10.1002/crat.2170180810
File:
PDF, 410 KB
english, 1983