Characterization of multilayer systems by high-resolution...

Characterization of multilayer systems by high-resolution x-ray diffraction

Andreas Appel, Ulrich Bonse, Jean-Louis Staudenmann
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Volume:
81
Year:
1990
Language:
english
Pages:
9
DOI:
10.1007/bf01390817
File:
PDF, 842 KB
english, 1990
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