Effect of copper ion migration along grain boundaries of...

Effect of copper ion migration along grain boundaries of ZnS thin films

M. Grus, Dr. A. J. Horodecki, M. Lepek
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Volume:
25
Year:
1990
Language:
english
Pages:
1
DOI:
10.1002/crat.2170250826
File:
PDF, 268 KB
english, 1990
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