Defect control in semiconductors. Proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, The Yokohama 21st Century Forum, Yokohama, Japan, September 17–22, 1989. North-Holland, Amsterdam, New York, Oxford, Tokyo, 1990 Volume I 972 pages, Volume II 760 pages, Proce: US $ 436.00/Dfl. 850.00, ISBN 0444884297
G. Wagner, K. SuminoVolume:
26
Année:
1991
Langue:
english
Pages:
1
DOI:
10.1002/crat.2170260825
Fichier:
PDF, 94 KB
english, 1991