X-ray diffraction studies on the core part of the...

Crystal Research and Technology 1994 Vol. 29; Iss. 3

X-ray diffraction studies on the core part of the Czochralski-grown Bi12SiO20 crystal

Tu Hengyong, Dr. Xu Xuewu, Liao Jingying
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Volume:
29
Year:
1994
Language:
english
Pages:
1
DOI:
10.1002/crat.2170290334
File:
PDF, 139 KB
english, 1994
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