Imaging crystal growth features using scanning force...

Crystal Research and Technology 1994 Vol. 29; Iss. 7

Imaging crystal growth features using scanning force microscopy (SFM)

S. Kipp, Dr. S. Kämmer, Prof. Dr.-Ing. R. Lacmann, Dr. J. Rolfs, U. Tanneberger, Dr. habil. W. Beckmann
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Volume:
29
Year:
1994
Language:
english
Pages:
7
DOI:
10.1002/crat.2170290716
File:
PDF, 483 KB
english, 1994
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