![](/img/cover-not-exists.png)
X-ray diffraction investigation of structure perfection state of silicon crystals after irradiation by fast uranium ions
Prof.J. Auleytner, V. Khrupa, A. Briginets, M. Skorokhold, Prof.L. DatsenkoVolume:
30
Year:
1995
Language:
english
Pages:
7
DOI:
10.1002/crat.2170300217
File:
PDF, 438 KB
english, 1995