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The as-Grown SiC (0001) Surface as Observed by Reflection Electron Microscopy
Dr. T. Marek, J. Heindl, Prof. Dr. H. P. Strunk, R. Eckstein, St. G. Müller, D. HofmannVolume:
31
Year:
1996
Language:
english
Pages:
5
DOI:
10.1002/crat.2170310807
File:
PDF, 920 KB
english, 1996