Quantitative analysis of thin film-substrate interdiffusion...

Quantitative analysis of thin film-substrate interdiffusion by GDOS and by Auger electron spectroscopy

Zdeněk Weiss, Jan Šuba
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Volume:
42
Language:
english
Pages:
6
DOI:
10.1007/bf01605224
Date:
May, 1992
File:
PDF, 269 KB
english, 1992
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