On the Causes and Effects of Contaminations during rf Diode...

On the Causes and Effects of Contaminations during rf Diode Deposition of Cr-Si Alloys

G. Sobe, H. Schreiber, G. Weise, A. Heinrich
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
33
Year:
1993
Language:
english
Pages:
11
DOI:
10.1002/ctpp.2150330411
File:
PDF, 568 KB
english, 1993
Conversion to is in progress
Conversion to is failed