Atomic force microscopy on (001) surfaces of GaAs MOVPE layers
Dr. Ines Pietzonka, Dr. Dietmar Hirsch, Dr. Volker Gottschalch, Dr. Reinhard Schwabe, Dr. Reiner Franzheld, Prof. Klaus Bente, Prof. Frieder BiglVolume:
2
Year:
1996
Language:
english
Pages:
5
DOI:
10.1002/cvde.19960020204
File:
PDF, 849 KB
english, 1996