Determination of the stoichiometry of vanadium nitride films by proton back-scattering
J. V. Ramana, V. S. Raju, A. K. Ray, S. Gangadharan, R. S. Srinivasa, A. N. ChandorkarVolume:
174
Language:
english
Pages:
6
DOI:
10.1007/bf02037913
Date:
December, 1993
File:
PDF, 261 KB
english, 1993