Muon diffusion and trapping by defects in...

Hyperfine Interactions 1984 / 01 Vol. 17; Iss. 1-4

Muon diffusion and trapping by defects in electron-irradiated Nb and Ta

T. Aurenz, K. -P. Arnold, K. -P. Döring, M. Gladisch, N. Haas, D. Herlach, W. Jacobs, M. Krause, M. Krauth, H. Orth, H. -E. Schaefer, K. Schulze, A. Seeger
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Volume:
17
Language:
english
Pages:
6
DOI:
10.1007/bf02065901
Date:
January, 1984
File:
PDF, 261 KB
english, 1984
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