X-Ray-Interferometric Determination of Å-scale Lattice...

X-Ray-Interferometric Determination of Å-scale Lattice Shifts at the Surface of Silicon Crystals — the Analogue to Light-Optical Interference Microscopy

Dr. M. Bartscher, U. Bonse
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Volume:
33
Year:
1998
Language:
english
Pages:
7
DOI:
10.1002/(sici)1521-4079(1998)33:43.0.co;2-y
File:
PDF, 223 KB
english, 1998
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