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Characterization of Flat and Bent Crystals for X-ray Spectroscopy and Imaging
G. Hölzer, O. Wehrhan, E. FörsterVolume:
33
Year:
1998
Language:
english
Pages:
13
DOI:
10.1002/(sici)1521-4079(1998)33:43.0.co;2-q
File:
PDF, 271 KB
english, 1998