Transmission Electron Microscope Study of Secondary Phases...

Transmission Electron Microscope Study of Secondary Phases in Cr3+:LiCaAlF6 Single Crystals

G. Lacayo, I. Hähnert, D. Klimm, P. Reiche, W. Neumann
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Volume:
34
Year:
1999
Language:
english
Pages:
7
DOI:
10.1002/(sici)1521-4079(199911)34:93.0.co;2-u
File:
PDF, 844 KB
english, 1999
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