Electron beam damage Josephson junctions: The relation between beam damage profile and electrical properties
A. J. Pauza, W. E. Booij, D. F. Moore, Y. YuanVolume:
46
Year:
1996
Language:
english
Pages:
2
DOI:
10.1007/bf02562777
File:
PDF, 242 KB
english, 1996