3D-XY critical behavior in La2−xSrxCuO4thin films probed by...

Czechoslovak Journal of Physics 1996 Vol. 46; Iss. 2 Suppleme

3D-XY critical behavior in La2−xSrxCuO4thin films probed by penetration depth measurement

Y. Jaccard, T. Schneider, J. -P. Locquet, E. J. Williams, Ø. Fischer, P. Martinoli
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
46
Year:
1996
Language:
english
Pages:
2
DOI:
10.1007/bf02583847
File:
PDF, 154 KB
english, 1996
Conversion to is in progress
Conversion to is failed