Variable energy positron beam characterization of defects...

Journal of Electronic Materials 1993 / 12 Vol. 22; Iss. 12

Variable energy positron beam characterization of defects in as-grown and annealed low temperature grown GaAs

M. T. Umlor, D. J. Keeble, P. W. Cooke, P. Asoka-Kumar, K. G. Lynn
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Volume:
22
Language:
english
Pages:
4
DOI:
10.1007/bf02649986
Date:
December, 1993
File:
PDF, 369 KB
english, 1993
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