Characterization of the high-temperature phase fields near...

Characterization of the high-temperature phase fields near stoichiometric γ-TiAl

S. C. Huang, P. A. Siemers
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Volume:
20
Language:
english
Pages:
8
DOI:
10.1007/bf02650276
Date:
October, 1989
File:
PDF, 2.84 MB
english, 1989
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