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Interpretation of hall and resistivity measurements in polycrystalline silicon
A. K. Ghosh, A. Rose, H. P. Maruska, T. Feng, D. J. EustaceVolume:
11
Language:
english
Pages:
24
DOI:
10.1007/bf02654670
Date:
March, 1982
File:
PDF, 893 KB
english, 1982