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Reflectance and photoreflectance for in-situ monitoring of the molecular beam epitaxial growth of CdTe and Hg-based materials
Zhonghai Yu, M. A. Mattson, T. H. Myers, K. A. Harris, R. W. Yanka, L. M. Mohnkern, L. C. Lew Yan Voon, L. R. Ram-Mohan, R. G. Benz, B. K. Wagner, C. J. SummersBenzVolume:
24
Language:
english
Pages:
6
DOI:
10.1007/bf02657979
Date:
May, 1995
File:
PDF, 622 KB
english, 1995