Piezoreflectance characterization of resonant tunneling and...

Journal of Electronic Materials 1989 / 05 Vol. 18; Iss. 3

Piezoreflectance characterization of resonant tunneling and modulation-doped heterostructures

R. L. Tober, J. Pamulapati, P. K. Bhattacharya, J. E. Oh
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Volume:
18
Language:
english
Pages:
6
DOI:
10.1007/bf02657986
Date:
May, 1989
File:
PDF, 530 KB
english, 1989
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