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X-Ray diffraction line profile analysis on the microstructure of cold-worked face-centered cubic Cu-Ge-Si alloys: Effects of dilute solutes Si and GE
S. K. Pradhan, M. DeVolume:
20
Language:
english
Pages:
3
DOI:
10.1007/bf02663219
Date:
September, 1989
File:
PDF, 313 KB
english, 1989