Mechanical properties and microstructural characterization...

Mechanical properties and microstructural characterization of Al-0.5%Cu thin films

Ramnath Venkatraman, John C. Bravman, W. D. Nix, Paul W. D Avies, Paul A. Flinn, David B. Fraser
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
19
Language:
english
Pages:
7
DOI:
10.1007/bf02673337
Date:
November, 1990
File:
PDF, 2.36 MB
english, 1990
Conversion to is in progress
Conversion to is failed