![](/img/cover-not-exists.png)
Mechanical properties and microstructural characterization of Al-0.5%Cu thin films
Ramnath Venkatraman, John C. Bravman, W. D. Nix, Paul W. D Avies, Paul A. Flinn, David B. FraserVolume:
19
Language:
english
Pages:
7
DOI:
10.1007/bf02673337
Date:
November, 1990
File:
PDF, 2.36 MB
english, 1990