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On-Line Characterization of Submicron Particles from High Concentration Sources via Mobility Analysis
Matthias Katzer, Eberhard Schmidt, Gerhard KasperVolume:
21
Year:
1998
Language:
english
Pages:
8
DOI:
10.1002/(sici)1521-4125(199803)21:33.0.co;2-0
File:
PDF, 295 KB
english, 1998