A quantitative study of diffracted X-ray intensities from type I natural diamond crystals by high resolution X-ray diffractometry and comparison with nearly perfect silicon single crystals
Krishan Lal, S Niranjana, N Goswami, Ajit Ram VermaVolume:
34
Language:
english
Pages:
17
DOI:
10.1007/bf02846428
Date:
June, 1990
File:
PDF, 1.26 MB
english, 1990