Hydrogen- and carbon-related defects in heavily...

Hydrogen- and carbon-related defects in heavily carbon-doped GaAs induced degradation under minority-carrier injection

Hiroshi Fushimi, Kazumi Wada
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Volume:
93
Year:
2010
Language:
english
Pages:
9
DOI:
10.1002/ecj.10208
File:
PDF, 289 KB
english, 2010
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