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A DFT method for BIST of RTL data paths based on single-control testability
Minoru Izutsu, Hiroki Wada, Toshimitsu Masuzawa, Hideo FujiwaraVolume:
86
Year:
2003
Language:
english
Pages:
10
DOI:
10.1002/ecjb.10122
File:
PDF, 1.05 MB
english, 2003