Post-breakdown conduction mechanism of thin oxide films and...

Post-breakdown conduction mechanism of thin oxide films and their aspects

Kenji Komiya, Takashi Oka, Naoki Okada, Yasuhisa Omura
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Volume:
86
Year:
2003
Language:
english
Pages:
7
DOI:
10.1002/ecjb.1119
File:
PDF, 968 KB
english, 2003
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