BAST: BIST-aided scan test. A new method for test cost...

Electronics and Communications in Japan (Part II: Electronics)) 2007 Vol. 90; Iss. 5

BAST: BIST-aided scan test. A new method for test cost reduction

Takashi Aikyo, Takahisa Hiraide, Michiaki Emori
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Volume:
90
Year:
2007
Language:
english
Pages:
8
DOI:
10.1002/ecjb.20356
File:
PDF, 480 KB
english, 2007
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