New microscope for measuring the distribution of nonlinear...

New microscope for measuring the distribution of nonlinear dielectric properties

Yasuo Cho, Akio Kirihara, Takahiro Saeki
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Volume:
79
Year:
1996
Language:
english
Pages:
8
DOI:
10.1002/ecjb.4420790608
File:
PDF, 504 KB
english, 1996
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