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Fixed pattern noise of amplified MOS imager in scaling down
Fumihiko Andoh, Katsu Tanaka, Hiroshi Kawashima, Masao YamawakiVolume:
79
Year:
1996
Language:
english
Pages:
12
DOI:
10.1002/ecjb.4420790811
File:
PDF, 785 KB
english, 1996