Reliability simulation of AC hot carrier degradation for deep sub-micron MOSFETs
Satoshi Shimizu, Motoaki Tanizawa, Shigeru Kusunoki, Masahide Inuishi, Hirokazu MiyoshiVolume:
79
Year:
1996
Language:
english
Pages:
9
DOI:
10.1002/ecjb.4420791103
File:
PDF, 702 KB
english, 1996