Optimal periodic testing policy for a system with...

Electronics and Communications in Japan (Part III: Fundamental Electronic Science)) 2005 Vol. 88; Iss. 4

Optimal periodic testing policy for a system with self-testing

Satoshi Mizutani, Toshio Nakagawa, Kodo Ito, Hiroaki Sandoh
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Volume:
88
Year:
2005
Language:
english
Pages:
9
DOI:
10.1002/ecjc.10167
File:
PDF, 1.17 MB
english, 2005
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