Long-term reliability evaluation of power semiconductor...

Long-term reliability evaluation of power semiconductor devices used in power station rectifiers and substation rectifiers

Toshikazu Horiuchi, Yoshitaka Sugawara
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Volume:
136
Year:
2001
Language:
english
Pages:
9
DOI:
10.1002/eej.1066
File:
PDF, 332 KB
english, 2001
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