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MOS transient: A powerful analysis technique for in-process monitoring of nuclear detectors
O. Evrard, P. Burger, F. Broz, L. van Buul, M. Keters, J. VerplanckeVolume:
112
Language:
english
Pages:
14
DOI:
10.1007/bf03185595
Date:
November, 1999
File:
PDF, 680 KB
english, 1999