Dislocations in strained layers: The Ge-Si system

JOM Journal of the Minerals, Metals and Materials Society 1994 / 03 Vol. 46; Iss. 3

Dislocations in strained layers: The Ge-Si system

Eric P. Kvam, Srikanth B. Samavedam
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Volume:
46
Language:
english
Pages:
5
DOI:
10.1007/bf03220651
Date:
March, 1994
File:
PDF, 1.18 MB
english, 1994
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