Small sample corrections for LTS and MCD

Metrika 2002 / 04 Vol. 55; Iss. 1-2

Small sample corrections for LTS and MCD

Pison, G., Aelst, S. Van, Willems, G.
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Volume:
55
Language:
english
Pages:
13
Journal:
Metrika
DOI:
10.1007/s001840200191
Date:
April, 2002
File:
PDF, 150 KB
english, 2002
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