Combined scanning tunneling and force microscope with fuzzy...

Applied Physics A: Materials Science & Processing 1998 / 03 Vol. 66; Iss. 1 Suppleme

Combined scanning tunneling and force microscope with fuzzy controlled feedback

Battiston, F.M., Bammerlin, M., Loppacher, Ch., Guggisberg, M., L&#x000FC, thi, R., Meyer, E., Eggimann, F., G&#x000FC, ntherodt, H.-J.
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Volume:
66
Language:
english
Pages:
1
DOI:
10.1007/s003390051098
Date:
March, 1998
File:
PDF, 2.19 MB
english, 1998
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